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A new ion sensing deep atomic force microscope
Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conven...
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| Main Authors: | , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
American Institute of Physics
2014
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4149697/ https://ncbi.nlm.nih.gov/pubmed/25173275 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4893640 |
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