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Currents Induced by Injected Charge in Junction Detectors

The problem of drifting charge-induced currents is considered in order to predict the pulsed operational characteristics in photo- and particle-detectors with a junction controlled active area. The direct analysis of the field changes induced by drifting charge in the abrupt junction devices with a...

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Bibliografiske detaljer
Main Authors: Gaubas, Eugenijus, Ceponis, Tomas, Kalesinskas, Vidas
Format: Artigo
Sprog:Inglês
Udgivet: MDPI 2013
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC3821295/
https://ncbi.nlm.nih.gov/pubmed/24036586
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s130912295
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