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Structured illumination quantitative phase microscopy for enhanced resolution amplitude and phase imaging
Structured illumination microscopy (SIM) is an established microscopy technique typically used to image samples at resolutions beyond the diffraction limit. Until now, however, achieving sub-diffraction resolution has predominantly been limited to intensity-based imaging modalities. Here, we introdu...
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| Main Authors: | , |
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| 格式: | Artigo |
| 語言: | Inglês |
| 出版: |
Optical Society of America
2013
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| 主題: | |
| 在線閱讀: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3799646/ https://ncbi.nlm.nih.gov/pubmed/24156044 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/BOE.4.001795 |
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