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Structured illumination quantitative phase microscopy for enhanced resolution amplitude and phase imaging

Structured illumination microscopy (SIM) is an established microscopy technique typically used to image samples at resolutions beyond the diffraction limit. Until now, however, achieving sub-diffraction resolution has predominantly been limited to intensity-based imaging modalities. Here, we introdu...

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Detalhes bibliográficos
Main Authors: Chowdhury, Shwetadwip, Izatt, Joseph
Formato: Artigo
Idioma:Inglês
Publicado em: Optical Society of America 2013
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3799646/
https://ncbi.nlm.nih.gov/pubmed/24156044
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/BOE.4.001795
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