Carregant...

Structured illumination quantitative phase microscopy for enhanced resolution amplitude and phase imaging

Structured illumination microscopy (SIM) is an established microscopy technique typically used to image samples at resolutions beyond the diffraction limit. Until now, however, achieving sub-diffraction resolution has predominantly been limited to intensity-based imaging modalities. Here, we introdu...

Descripció completa

Guardat en:
Dades bibliogràfiques
Autors principals: Chowdhury, Shwetadwip, Izatt, Joseph
Format: Artigo
Idioma:Inglês
Publicat: Optical Society of America 2013
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC3799646/
https://ncbi.nlm.nih.gov/pubmed/24156044
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/BOE.4.001795
Etiquetes: Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!