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Structured illumination diffraction phase microscopy for broadband, sub-diffraction resolution, quantitative phase imaging
Structured illumination microscopy (SIM) is an established technique that allows sub-diffraction resolution imaging by heterodyning high sample frequencies into the system’s passband via structured illumination. However, until now, SIM has been typically used to achieve sub-diffraction resolution fo...
Wedi'i Gadw mewn:
| Cyhoeddwyd yn: | Opt Lett |
|---|---|
| Prif Awduron: | , |
| Fformat: | Artigo |
| Iaith: | Inglês |
| Cyhoeddwyd: |
2014
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| Pynciau: | |
| Mynediad Ar-lein: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4704703/ https://ncbi.nlm.nih.gov/pubmed/24562266 |
| Tagiau: |
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