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Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction

In X-ray interference fringes accompanied by mirage diffraction, variations have been observed in the spacing and position of the fringes from a plane-parallel Si single crystal fixed at one end as a function of distance from the incident plane of the X-rays to the free crystal end. The variations c...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Jongsukswat, Sukswat, Fukamachi, Tomoe, Ju, Dongying, Negishi, Riichirou, Hirano, Keiichi, Kawamura, Takaaki
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: International Union of Crystallography 2013
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC3778321/
https://ncbi.nlm.nih.gov/pubmed/24068841
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0021889813019067
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