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Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction
In X-ray interference fringes accompanied by mirage diffraction, variations have been observed in the spacing and position of the fringes from a plane-parallel Si single crystal fixed at one end as a function of distance from the incident plane of the X-rays to the free crystal end. The variations c...
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| Autors principals: | , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
International Union of Crystallography
2013
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3778321/ https://ncbi.nlm.nih.gov/pubmed/24068841 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0021889813019067 |
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