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High speed atomic force microscopy enabled by a sample profile estimator
In this paper, an estimation scheme for imaging in Atomic Force Microscopy (AFM) is presented which yields imaging rates well beyond the bandwidth of the vertical positioner and allows for high-speed AFM on a typical commercial instrument. The estimator can be applied to existing instruments with li...
Gorde:
| Egile Nagusiak: | , |
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| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
AIP Publishing LLC
2013
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3683030/ https://ncbi.nlm.nih.gov/pubmed/23825804 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4808211 |
| Etiketak: |
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