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Note: Fast imaging of DNA in atomic force microscopy enabled by a local raster scan algorithm
Approaches to high-speed atomic force microscopy typically involve some combination of novel mechanical design to increase the physical bandwidth and advanced controllers to take maximum advantage of the physical capabilities. For certain classes of samples, however, imaging time can be reduced on s...
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| Main Authors: | , |
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| Format: | Artigo |
| Language: | Inglês |
| Published: |
AIP Publishing LLC
2014
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| Subjects: | |
| Online Access: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4048448/ https://ncbi.nlm.nih.gov/pubmed/24985865 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4881682 |
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