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The Three-Dimensional Point Spread Function of Aberration-Corrected Scanning Transmission Electron Microscopy

Aberration-correction reduces the depth of field in scanning transmission electron microscopy (STEM) and thus allows three-dimensional imaging by depth-sectioning. This imaging mode offers the potential for sub-Ångstrom lateral resolution and nanometer-scale depth sensitivity. For biological samples...

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Bibliografische gegevens
Hoofdauteurs: Lupini, A.R., de Jonge, N.
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: 2011
Onderwerpen:
Online toegang:https://ncbi.nlm.nih.gov/pmc/articles/PMC3390684/
https://ncbi.nlm.nih.gov/pubmed/21878149
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1017/S1431927611011913
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