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The Three-Dimensional Point Spread Function of Aberration-Corrected Scanning Transmission Electron Microscopy
Aberration-correction reduces the depth of field in scanning transmission electron microscopy (STEM) and thus allows three-dimensional imaging by depth-sectioning. This imaging mode offers the potential for sub-Ångstrom lateral resolution and nanometer-scale depth sensitivity. For biological samples...
Tallennettuna:
| Päätekijät: | , |
|---|---|
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
2011
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3390684/ https://ncbi.nlm.nih.gov/pubmed/21878149 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1017/S1431927611011913 |
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