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The Probe Profile and Lateral Resolution of Scanning Transmission Electron Microscopy of Thick Specimens
Lateral profiles of the electron probe of scanning transmission electron microscopy (STEM) were simulated at different vertical positions in a micrometers-thick carbon sample. The simulations were carried out using the Monte Carlo method in the CASINO software. A model was developed to fit the probe...
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| 主要な著者: | , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
2012
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3389604/ https://ncbi.nlm.nih.gov/pubmed/22564444 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1017/S1431927612000232 |
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