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Automated specimen search in cryo-TEM observation with DIFF-defocus imaging
We have developed an automated specimen search algorithm for cryo-electron microscopy imaging of ice-embedded single particles suspended across regularly spaced holes. To maximize the particle visibility under a low electron exposure rate condition, specimen searching is carried out in diffraction m...
Tallennettuna:
| Päätekijät: | , , , , , , |
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| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Oxford University Press
2010
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3388909/ https://ncbi.nlm.nih.gov/pubmed/20356853 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/jmicro/dfq009 |
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