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Deterministic conversion between memory and threshold resistive switching via tuning the strong electron correlation

Intensive investigations have been launched worldwide on the resistive switching (RS) phenomena in transition metal oxides due to both fascinating science and potential applications in next generation nonvolatile resistive random access memory (RRAM) devices. It is noteworthy that most of these oxid...

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Bibliografiske detaljer
Main Authors: Peng, Hai Yang, Li, Yong Feng, Lin, Wei Nan, Wang, Yu Zhan, Gao, Xing Yu, Wu, Tom
Format: Artigo
Sprog:Inglês
Udgivet: Nature Publishing Group 2012
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC3369197/
https://ncbi.nlm.nih.gov/pubmed/22679556
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep00442
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