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Characterization of ultrathin InSb nanocrystals film deposited on SiO(2)/Si substrate
Recently, solid-phase recrystallization of ultrathin indium antimonide nanocrystals (InSb NCs (films grown on SiO(2)/Si substrate is very attractive, because of the rapid development of thermal annealing technique. In this study, the recrystallization behavior of 35 nm indium antimonide film was stu...
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| Hlavní autoři: | , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Springer
2011
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3339497/ https://ncbi.nlm.nih.gov/pubmed/22112251 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-6-601 |
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