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A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope

Measurements of the frequency shift versus distance in noncontact atomic force microscopy (NC-AFM) allow measurements of the force gradient between the oscillating tip and a surface (force-spectroscopy measurements). When nonconservative forces act between the tip apex and the surface the oscillatio...

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Xehetasun bibliografikoak
Egile Nagusiak: Lange, Manfred, van Vörden, Dennis, Möller, Rolf
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Beilstein-Institut 2012
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC3323909/
https://ncbi.nlm.nih.gov/pubmed/22496993
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.3.23
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