Genetic Architecture of Highly Complex Chemical Resistance Traits across Four Yeast Strains

Many questions about the genetic basis of complex traits remain unanswered. This is in part due to the low statistical power of traditional genetic mapping studies. We used a statistically powerful approach, extreme QTL mapping (X-QTL), to identify the genetic basis of resistance to 13 chemicals in...

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Detaylı Bibliyografya
Asıl Yazarlar: Ehrenreich, Ian M., Bloom, Joshua, Torabi, Noorossadat, Wang, Xin, Jia, Yue, Kruglyak, Leonid
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: Public Library of Science 2012
Konular:
Research Article
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC3305394/
https://ncbi.nlm.nih.gov/pubmed/22438822
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pgen.1002570
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