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Genetic Architecture of Highly Complex Chemical Resistance Traits across Four Yeast Strains

Many questions about the genetic basis of complex traits remain unanswered. This is in part due to the low statistical power of traditional genetic mapping studies. We used a statistically powerful approach, extreme QTL mapping (X-QTL), to identify the genetic basis of resistance to 13 chemicals in...

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Detalhes bibliográficos
Main Authors: Ehrenreich, Ian M., Bloom, Joshua, Torabi, Noorossadat, Wang, Xin, Jia, Yue, Kruglyak, Leonid
Formato: Artigo
Idioma:Inglês
Publicado em: Public Library of Science 2012
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Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3305394/
https://ncbi.nlm.nih.gov/pubmed/22438822
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pgen.1002570
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