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In situ imaging of the conducting filament in a silicon oxide resistive switch

The nature of the conducting filaments in many resistive switching systems has been elusive. Through in situ transmission electron microscopy, we image the real-time formation and evolution of the filament in a silicon oxide resistive switch. The electroforming process is revealed to involve the loc...

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Detalles Bibliográficos
Main Authors: Yao, Jun, Zhong, Lin, Natelson, Douglas, Tour, James M.
Formato: Artigo
Idioma:Inglês
Publicado: Nature Publishing Group 2012
Assuntos:
Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC3268812/
https://ncbi.nlm.nih.gov/pubmed/22355755
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep00242
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