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Microscopic study of electrical properties of CrSi(2 )nanocrystals in silicon
Semiconducting CrSi(2 )nanocrystallites (NCs) were grown by reactive deposition epitaxy of Cr onto n-type silicon and covered with a 50-nm epitaxial silicon cap. Two types of samples were investigated: in one of them, the NCs were localized near the deposition depth, and in the other they migrated n...
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| Hlavní autoři: | , , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Springer
2011
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3211265/ https://ncbi.nlm.nih.gov/pubmed/21711727 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-6-209 |
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