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AFM-assisted fabrication of thiol SAM pattern with alternating quantified surface potential
Thiol self-assembled monolayers (SAMs) are widely used in many nano- and bio-technology applications. We report a new approach to create and characterize a thiol SAMs micropattern with alternating charges on a flat gold-coated substrate using atomic force microscopy (AFM) and Kelvin probe force micr...
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| 主要な著者: | , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Springer
2011
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3211238/ https://ncbi.nlm.nih.gov/pubmed/21711703 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-6-185 |
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