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Memory properties and charge effect study in Si nanocrystals by scanning capacitance microscopy and spectroscopy
In this letter, isolated Si nanocrystal has been formed by dewetting process with a thin silicon dioxide layer on top. Scanning capacitance microscopy and spectroscopy were used to study the memory properties and charge effect in the Si nanocrystal in ambient temperature. The retention time of trapp...
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| Главные авторы: | , , |
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| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
Springer
2011
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| Предметы: | |
| Online-ссылка: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3211215/ https://ncbi.nlm.nih.gov/pubmed/21711692 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-6-163 |
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