APA引文

Lin, Z., Bremond, G., & Bassani, F. (2011). Memory properties and charge effect study in Si nanocrystals by scanning capacitance microscopy and spectroscopy. Springer.

Citação norma Chicago

Lin, Zhen, Georges Bremond, and Franck Bassani. Memory Properties and Charge Effect Study in Si Nanocrystals By Scanning Capacitance Microscopy and Spectroscopy. Springer, 2011.

MLA引文

Lin, Zhen, Georges Bremond, and Franck Bassani. Memory Properties and Charge Effect Study in Si Nanocrystals By Scanning Capacitance Microscopy and Spectroscopy. Springer, 2011.