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Nanoscale electrical property studies of individual GeSi quantum rings by conductive scanning probe microscopy
The nanoscale electrical properties of individual self-assembled GeSi quantum rings (QRs) were studied by scanning probe microscopy-based techniques. The surface potential distributions of individual GeSi QRs are obtained by scanning Kelvin microscopy (SKM). Ring-shaped work function distributions a...
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| Hlavní autoři: | , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Springer
2012
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3524759/ https://ncbi.nlm.nih.gov/pubmed/23194252 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-7-659 |
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