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Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12 )thin films
The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu(3)Ti(4)O(12 )(CCTO) thin films deposited by MOCVD on IrO(2 )bottom electrode. In particular, both techniques have been employed to clarify the role of the inter- and sub-granular featur...
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| Main Authors: | , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Springer
2011
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3211163/ https://ncbi.nlm.nih.gov/pubmed/21711646 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-6-118 |
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