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Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12 )thin films
The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu(3)Ti(4)O(12 )(CCTO) thin films deposited by MOCVD on IrO(2 )bottom electrode. In particular, both techniques have been employed to clarify the role of the inter- and sub-granular featur...
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| Hlavní autoři: | , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Springer
2011
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3211163/ https://ncbi.nlm.nih.gov/pubmed/21711646 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-6-118 |
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