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Sub-Angstrom Low Voltage Performance of a Monochromated, Aberration-Corrected Transmission Electron Microscope
Lowering the electron energy in the transmission electron microscope allows for a significant improvement in contrast of light elements, and reduces knock-on damage for most materials. If low-voltage electron microscopes are defined as those with accelerating voltages below 100 kV, the introduction...
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| Autores principales: | , , |
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| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
2010
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| Materias: | |
| Acceso en línea: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3113635/ https://ncbi.nlm.nih.gov/pubmed/20598206 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1017/S1431927610093670 |
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