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Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope
Scanning transmission electron microscopy (STEM) excels in accessing atomic-scale structure and chemistry. Enhancing our ability to directly image the functionalities of local features in materials has become one of the most important topics in the future development of STEM. Recently, differential...
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| Publicat a: | Adv Struct Chem Imaging |
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| Autors principals: | , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Springer International Publishing
2018
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6132373/ https://ncbi.nlm.nih.gov/pubmed/30221126 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s40679-018-0059-4 |
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