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Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope
Scanning transmission electron microscopy (STEM) excels in accessing atomic-scale structure and chemistry. Enhancing our ability to directly image the functionalities of local features in materials has become one of the most important topics in the future development of STEM. Recently, differential...
Uloženo v:
| Vydáno v: | Adv Struct Chem Imaging |
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| Hlavní autoři: | , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Springer International Publishing
2018
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6132373/ https://ncbi.nlm.nih.gov/pubmed/30221126 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s40679-018-0059-4 |
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