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Serial sectioning for examination of photoreceptor cell architecture by focused ion beam technology
Structurally deciphering complex neural networks requires technology with sufficient resolution to allow visualization of single cells and their intimate surrounding connections. Scanning electron microscopy (SEM), coupled with serial ion ablation (SIA) technology, presents a new avenue to study the...
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| Auteurs principaux: | , , , , , |
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| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
2011
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| Sujets: | |
| Accès en ligne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3090522/ https://ncbi.nlm.nih.gov/pubmed/21439323 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jneumeth.2011.03.013 |
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