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Serial sectioning for examination of photoreceptor cell architecture by focused ion beam technology
Structurally deciphering complex neural networks requires technology with sufficient resolution to allow visualization of single cells and their intimate surrounding connections. Scanning electron microscopy (SEM), coupled with serial ion ablation (SIA) technology, presents a new avenue to study the...
में बचाया:
| मुख्य लेखकों: | , , , , , |
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| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
2011
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| विषय: | |
| ऑनलाइन पहुंच: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3090522/ https://ncbi.nlm.nih.gov/pubmed/21439323 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jneumeth.2011.03.013 |
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