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Comparison of Bi(1)(+), Bi(3)(+) and C(60)(+) primary ion sources for ToF-SIMS imaging of patterned protein samples
Imaging time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been used to study protein bound to a photolithographically-patterned, commercial poly(ethylene glycol) (PEG)-based polymer film. The effect of different ion sources on the fragmentation pattern from this sample was analyzed with...
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| Hlavní autoři: | , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
2011
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3079216/ https://ncbi.nlm.nih.gov/pubmed/21516225 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/sia.3537 |
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