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Exploring the Surface Sensitivity of ToF-SIMS by Measuring the Implantation and Sampling Depths of Bi(n) and C(60) Ions in Organic Films
The surface sensitivity of Bi(n)(q+) (n = 1, 3, 5, q = 1, 2) and C(60)(q+) (q = 1, 2) primary ions in static time-of-flight secondary ion mass spectrometry (ToF-SIMS) experiments were investigated for molecular trehalose and polymeric tetraglyme organic films. Parameters related to surface sensitivi...
Gorde:
| Egile Nagusiak: | , , |
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| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
2011
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3259203/ https://ncbi.nlm.nih.gov/pubmed/22084828 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/ac202713k |
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