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Dual-axis electron tomography of biological specimens: extending the limits of specimen thickness with bright-field STEM imaging
The absence of imaging lenses after the specimen in the scanning transmission electron microscope (STEM) enables electron tomography to be performed in the STEM mode on micrometer-thick plastic-embedded specimens without the deleterious effect of chromatic aberration, which limits spatial resolution...
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| Main Authors: | , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
2010
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3056916/ https://ncbi.nlm.nih.gov/pubmed/21055473 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jsb.2010.10.017 |
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