Dual-axis electron tomography of biological specimens: extending the limits of specimen thickness with bright-field STEM imaging

The absence of imaging lenses after the specimen in the scanning transmission electron microscope (STEM) enables electron tomography to be performed in the STEM mode on micrometer-thick plastic-embedded specimens without the deleterious effect of chromatic aberration, which limits spatial resolution...

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Main Authors: Sousa, Alioscka A., Azari, Afrouz A., Zhang, Guofeng, Leapman, Richard D.
Formato: Artigo
Idioma:Inglês
Publicado: 2010
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Article
Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC3056916/
https://ncbi.nlm.nih.gov/pubmed/21055473
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jsb.2010.10.017
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