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Phase contrast coherence microscopy based on transverse scanning

We present what we believe to be a novel approach to measuring optical path length differences with a precision of a few nanometers. The instrument is based on transverse scanning or en-face optical coherence tomography. Owing to the fast motion of the scanning beam over the sample, excellent phase...

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Bibliografski detalji
Glavni autori: Pircher, Michael, Baumann, Bernhard, Götzinger, Erich, Sattmann, Harald, Hitzenberger, Christoph K.
Format: Artigo
Jezik:Inglês
Izdano: 2009
Teme:
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC2956977/
https://ncbi.nlm.nih.gov/pubmed/19529691
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