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Phase contrast coherence microscopy based on transverse scanning
We present what we believe to be a novel approach to measuring optical path length differences with a precision of a few nanometers. The instrument is based on transverse scanning or en-face optical coherence tomography. Owing to the fast motion of the scanning beam over the sample, excellent phase...
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| Hauptverfasser: | , , , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
2009
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2956977/ https://ncbi.nlm.nih.gov/pubmed/19529691 |
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