載入...
Creation of Controlled Defects Inside Colloidal Crystal Arrays with a Focused Ion Beam
In this work the reliability of the focused-ion-beam (FIB) patterning on polystyrene (PS) colloidal crystals at different scales is determined. Ordered arrays of PS spheres (465 nm) are successfully modified by selectively removing a single sphere. The water-vapor assisted FIB milling is crucial to...
Na minha lista:
| Main Authors: | , |
|---|---|
| 格式: | Artigo |
| 語言: | Inglês |
| 出版: |
Springer
2010
|
| 主題: | |
| 在線閱讀: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2894035/ https://ncbi.nlm.nih.gov/pubmed/20596416 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1007/s11671-010-9623-0 |
| 標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|