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Creation of Controlled Defects Inside Colloidal Crystal Arrays with a Focused Ion Beam
In this work the reliability of the focused-ion-beam (FIB) patterning on polystyrene (PS) colloidal crystals at different scales is determined. Ordered arrays of PS spheres (465 nm) are successfully modified by selectively removing a single sphere. The water-vapor assisted FIB milling is crucial to...
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| Main Authors: | , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Springer
2010
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2894035/ https://ncbi.nlm.nih.gov/pubmed/20596416 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1007/s11671-010-9623-0 |
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