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Atomic force microscopy imaging and 3-D reconstructions of serial thin sections of a single cell and its interior structures
The thin sectioning has been widely applied in electron microscopy (EM), and successfully used for an in situ observation of inner ultrastructure of cells. This powerful technique has recently been extended to the research field of atomic force microscopy (AFM). However, there have been no reports d...
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| Hoofdauteurs: | , , , , , , |
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| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
2004
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| Onderwerpen: | |
| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2873076/ https://ncbi.nlm.nih.gov/pubmed/15850704 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2004.11.019 |
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