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Progress in the Correlative Atomic Force Microscopy and Optical Microscopy

Atomic force microscopy (AFM) has evolved from the originally morphological imaging technique to a powerful and multifunctional technique for manipulating and detecting the interactions between molecules at nanometer resolution. However, AFM cannot provide the precise information of synchronized mol...

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Detalhes bibliográficos
Publicado no:Sensors (Basel)
Main Authors: Zhou, Lulu, Cai, Mingjun, Tong, Ti, Wang, Hongda
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2017
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5426934/
https://ncbi.nlm.nih.gov/pubmed/28441775
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s17040938
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