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Progress in the Correlative Atomic Force Microscopy and Optical Microscopy
Atomic force microscopy (AFM) has evolved from the originally morphological imaging technique to a powerful and multifunctional technique for manipulating and detecting the interactions between molecules at nanometer resolution. However, AFM cannot provide the precise information of synchronized mol...
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| 出版年: | Sensors (Basel) |
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| 主要な著者: | , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
MDPI
2017
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5426934/ https://ncbi.nlm.nih.gov/pubmed/28441775 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s17040938 |
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