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Progress in the Correlative Atomic Force Microscopy and Optical Microscopy

Atomic force microscopy (AFM) has evolved from the originally morphological imaging technique to a powerful and multifunctional technique for manipulating and detecting the interactions between molecules at nanometer resolution. However, AFM cannot provide the precise information of synchronized mol...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Sensors (Basel)
Hauptverfasser: Zhou, Lulu, Cai, Mingjun, Tong, Ti, Wang, Hongda
Format: Artigo
Sprache:Inglês
Veröffentlicht: MDPI 2017
Schlagworte:
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC5426934/
https://ncbi.nlm.nih.gov/pubmed/28441775
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s17040938
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