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Pindel: a pattern growth approach to detect break points of large deletions and medium sized insertions from paired-end short reads

Motivation: There is a strong demand in the genomic community to develop effective algorithms to reliably identify genomic variants. Indel detection using next-gen data is difficult and identification of long structural variations is extremely challenging. Results: We present Pindel, a pattern growt...

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Autori principali: Ye, Kai, Schulz, Marcel H., Long, Quan, Apweiler, Rolf, Ning, Zemin
Natura: Artigo
Lingua:Inglês
Pubblicazione: Oxford University Press 2009
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Accesso online:https://ncbi.nlm.nih.gov/pmc/articles/PMC2781750/
https://ncbi.nlm.nih.gov/pubmed/19561018
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/bioinformatics/btp394
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