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Monitoring tablet surface roughness during the film coating process

The purpose of this study was to evaluate the change of surface roughness and the development of the film during the film coating process using laser profilometer roughness measurements, SEM imaging, and energy dispersive X-ray (EDX) analysis. Surface roughness and texture changes developing during...

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Autors principals: Seitavuopio, Paulus, Heinämäki, Jyrki, Rantanen, Jukka, Yliruusi, Jouko
Format: Artigo
Idioma:Inglês
Publicat: Springer-Verlag 2006
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Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC2750272/
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1208/pt070231
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