טוען...
DNA Deformations near Charged Surfaces: Electron and Atomic Force Microscopy Views
DNA is a very important cell structural element, which determines the level of expression of genes by virtue of its interaction with regulatory proteins. We use electron (EM) and atomic force microscopy (AFM) to characterize the flexibility of double-stranded DNA (∼150–950 nm long) close to a charge...
שמור ב:
| Main Authors: | , , , |
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| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
The Biophysical Society
2009
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2730647/ https://ncbi.nlm.nih.gov/pubmed/19686663 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.bpj.2009.06.015 |
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