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DNA Deformations near Charged Surfaces: Electron and Atomic Force Microscopy Views

DNA is a very important cell structural element, which determines the level of expression of genes by virtue of its interaction with regulatory proteins. We use electron (EM) and atomic force microscopy (AFM) to characterize the flexibility of double-stranded DNA (∼150–950 nm long) close to a charge...

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Detalhes bibliográficos
Main Authors: Faas, F.G.A., Rieger, B., van Vliet, L.J., Cherny, D.I.
Formato: Artigo
Idioma:Inglês
Publicado em: The Biophysical Society 2009
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC2730647/
https://ncbi.nlm.nih.gov/pubmed/19686663
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.bpj.2009.06.015
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