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Spatially Resolved Detection of a Nanometer-Scale Gap by Scanning Electrochemical Microscopy

Nanowires with nanometer-scale gaps are an emerging class of nanomaterials with potential applications in electronics and optics. Here we demonstrate that the feedback mode of scanning electrochemical microscopy (SECM) allows for spatially resolved detection of a nanogap on the basis of its electric...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Päätekijät: Kim, Eunkyoung, Kim, Jiyeon, Amemiya, Shigeru
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: 2009
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC2702147/
https://ncbi.nlm.nih.gov/pubmed/19518142
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/ac900349f
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