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Spatially Resolved Detection of a Nanometer-Scale Gap by Scanning Electrochemical Microscopy

Nanowires with nanometer-scale gaps are an emerging class of nanomaterials with potential applications in electronics and optics. Here we demonstrate that the feedback mode of scanning electrochemical microscopy (SECM) allows for spatially resolved detection of a nanogap on the basis of its electric...

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Auteurs principaux: Kim, Eunkyoung, Kim, Jiyeon, Amemiya, Shigeru
Format: Artigo
Langue:Inglês
Publié: 2009
Sujets:
Accès en ligne:https://ncbi.nlm.nih.gov/pmc/articles/PMC2702147/
https://ncbi.nlm.nih.gov/pubmed/19518142
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/ac900349f
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