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Spatially Resolved Detection of a Nanometer-Scale Gap by Scanning Electrochemical Microscopy

Nanowires with nanometer-scale gaps are an emerging class of nanomaterials with potential applications in electronics and optics. Here we demonstrate that the feedback mode of scanning electrochemical microscopy (SECM) allows for spatially resolved detection of a nanogap on the basis of its electric...

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Bibliographic Details
Main Authors: Kim, Eunkyoung, Kim, Jiyeon, Amemiya, Shigeru
Format: Artigo
Language:Inglês
Published: 2009
Subjects:
Online Access:https://ncbi.nlm.nih.gov/pmc/articles/PMC2702147/
https://ncbi.nlm.nih.gov/pubmed/19518142
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/ac900349f
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