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Maximum likelihood refinement of electron microscopy data with normalization errors
Commonly employed data models for maximum likelihood refinement of electron microscopy images behave poorly in the presence of normalization errors. Small variations in background mean or signal brightness are relatively common in cryo-electron microscopy data, and varying signal-to-noise ratios or...
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| Autores principales: | , , , , |
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| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
2009
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| Materias: | |
| Acceso en línea: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2693001/ https://ncbi.nlm.nih.gov/pubmed/19236920 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jsb.2009.02.007 |
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