Cargando...

Maximum likelihood refinement of electron microscopy data with normalization errors

Commonly employed data models for maximum likelihood refinement of electron microscopy images behave poorly in the presence of normalization errors. Small variations in background mean or signal brightness are relatively common in cryo-electron microscopy data, and varying signal-to-noise ratios or...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Scheres, Sjors H.W., Valle, Mikel, Grob, Patricia, Nogales, Eva, Carazo, José-María
Formato: Artigo
Lenguaje:Inglês
Publicado: 2009
Materias:
Acceso en línea:https://ncbi.nlm.nih.gov/pmc/articles/PMC2693001/
https://ncbi.nlm.nih.gov/pubmed/19236920
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jsb.2009.02.007
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!