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Axon Tracking in Serial Block-Face Scanning Electron Microscopy
Electron microscopy is an important modality for the analysis of neuronal structures in neurobiology. We address the problem of tracking axons across large distances in volumes acquired by Serial Block-Face Scanning Electron Microscopy (SBFSEM). This is a challenging problem due to the small cross-s...
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| Main Authors: | , , , , , , , |
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| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
2008
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2597704/ https://ncbi.nlm.nih.gov/pubmed/18617436 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.media.2008.05.002 |
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